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DESIGN FOR TEST FOR DIGITAL ICS AND EMBEDDED CORE SYSTEMS (Record no. 60247)

MARC details
000 -LEADER
fixed length control field 00432nam a2200157Ia 4500
003 - CONTROL NUMBER IDENTIFIER
control field AVIT
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250723121821.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 090811s2008 ||||||||||||||||| ||und|d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Printed Price INR 375.00
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Class No. 621.3815
100 ## - FIRST AUTHOR (IF A PERSON)
Name of author Crouch L Alfred
115.187.37.79 Author
245 #0 - TITLE STATEMENT
Title DESIGN FOR TEST FOR DIGITAL ICS AND EMBEDDED CORE SYSTEMS
Statement of responsibility Crouch L Alfred
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher PEARSON EDUCATION
Date of publication, distribution, etc. 2008
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Subject heading Computer Science
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Koha item type Books
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan (e.g. reference copy) Home library Current library Date acquired Source of acquisition Purchase price (after disc. etc) Total Checkouts Full call number Accession No Date last seen Price effective from Koha item type
          AVIT Central Library AVIT Central Library 11/08/2009 Bs@ds 375.00   621.3815 CRO-D 22188 20/11/2021 20/11/2021 Reference
    Dewey Decimal Classification     AVIT Central Library AVIT Central Library 11/08/2009 Bs@ds 375.00   621.3815 CRO-D 22189 20/11/2021 20/11/2021 Books